4. Optics: measuring and testing
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Reference plane production

Optics: measuring and testing – Fiducial instruments
Patent

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Reference scatter for use in the correction of scattering photom

Optics: measuring and testing – Sample – specimen – or standard holder or support
Patent

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Reference signal for stitching of interferometric profiles

Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate

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Reference signal generating configuration for an...

Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate

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Reference signal generating configuration for an...

Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate

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Reference system for optical devices including optical scanners

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Reference wafer for haze calibration

Optics: measuring and testing – Standard
Patent

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Reference wavelength light generating apparatus

Optics: measuring and testing – By dispersed light spectroscopy
Reexamination Certificate

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Reflectance and luminescence calibration plate having a near-Lam

Optics: measuring and testing – Standard
Patent

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Reflectance estimating method

Optics: measuring and testing – Of light reflection – With diffusion
Reexamination Certificate

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Reflectance measurement apparatus with noise reduction circuitry

Optics: measuring and testing – Of light reflection – With diffusion
Patent

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Reflectance measuring apparatus for making contactless measureme

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrophotometer
Patent

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Reflectance measuring apparatus for making contactless measureme

Optics: measuring and testing – By monitoring of webs or thread
Patent

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Reflectance measuring device

Optics: measuring and testing – Of light reflection – With diffusion
Patent

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Reflectance measuring instrument with integrating sphere

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrophotometer
Patent

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Reflectance method for evaluating the surface...

Optics: measuring and testing – By polarized light examination – With light attenuation
Reexamination Certificate

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Reflectance method for evaluating the surface...

Optics: measuring and testing – By polarized light examination – With light attenuation
Reexamination Certificate

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Reflectance method for evaluating the surface...

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Reexamination Certificate

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Reflectance method for evaluating the surface...

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Reexamination Certificate

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Reflectance method for evaluating the surface...

Optics: measuring and testing – Surface roughness
Reexamination Certificate

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