Reflectance measurement apparatus with noise reduction circuitry

Details Reflectance measurement apparatus with noise reduction circuitry Reflectance measurement apparatus with noise reduction circuitry

1991-02-11

1993-01-05

Evans, F. L.

Optics: measuring and testing

Of light reflection

With diffusion

356447, G01N 2147

Patent

active

051775654

ABSTRACT:
A reflectance meter having improved noise immunity for measuring photometric quantities is disclosed. The device includes noise reduction techniques for eliminating the effects of ambient and artificial light upon the measurement signal. A gated modulator provides frequency shifting of desired information to a carrier frequency so that undesired signals may be filtered out. A gated demodulator provides a means to demodulate the information contained in frequency spectrum near the gate or chopping frequency.

REFERENCES:
patent: 4258719 (1981-03-01), Lewyn
patent: 4800885 (1989-01-01), Johnson
Excerpt from Book by M. S. Roden Entitled Analog and Digital Communications Systems, Englewood Cliffs: Prentice-Hall, 1979.
Excerpt from Book by C. D. McGillem and G. R. Cooper Entitled Continuous and Discrete Signal and System Analysis, New York: Holt, Rinehart and Winston, Inc., 1974.

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