Search
Selected: I

In-situ metrology system and method

Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

In-situ metrology system and method for monitoring...

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

In-situ monitoring of electrical properties by ellipsometry

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

In-situ overlay alignment

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

In-situ particle detection utilizing optical coupling

Optics: measuring and testing – By particle light scattering
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

In-situ particle monitoring

Optics: measuring and testing – By particle light scattering
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

In-situ real-time monitoring technique and apparatus for...

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

In-situ reticle contamination detection system at exposure...

Optics: measuring and testing – For light transmission or absorption
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

In-situ source metrology instrument and method of use

Optics: measuring and testing – Lamp beam direction or pattern
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

In-situ source metrology instrument and method of use

Optics: measuring and testing – Lamp beam direction or pattern
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

In-situ spectrograph and method of measuring light...

Optics: measuring and testing – By dispersed light spectroscopy – For spectrographic investigation
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

In-situ spectrophotometric probe

Optics: measuring and testing – For light transmission or absorption – Of fluent material
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

In-situ thickness and refractive index monitoring and...

Optics: measuring and testing – Dimension – Thickness
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

In-situ thickness measurement for use in semiconductor...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

In-situ wave correction apparatus

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

In-stream spectroscopic elemental analysis of particles...

Optics: measuring and testing – For size of particles
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Incident light redistribution to compensate for radial...

Optics: measuring and testing – By shade or color – With color transmitting filter
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Inclination adjusting apparatus, ferrule clamping apparatus,...

Optics: measuring and testing – By light interference
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Inclination angle detection device and inclination angle...

Optics: measuring and testing – Angle measuring or angular axial alignment
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Inclination angle metering apparatus

Optics: measuring and testing – Angle measuring or angular axial alignment – Photodetection of inclination from level or vertical
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0
  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.