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Improvements in or relating to surface curvature measurement

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Improvements in sights for firearms and other articles

Optics: measuring and testing – Fiducial instruments
Patent

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In motion dimensioning system for cuboidal objects

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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In Situ alignment system for phase-shifting point-diffraction in

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

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In situ analysis apparatus

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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In situ chlorophyl absorption meter

Optics: measuring and testing – By shade or color – Fluid color transmission examination
Patent

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In situ determination of pixel mapping in interferometry

Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate

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In situ excitation for Surface Enhanced Raman Spectroscopy

Optics: measuring and testing – By dispersed light spectroscopy – With raman type light scattering
Reexamination Certificate

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In SITU measurement and compensation of errors due to...

Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate

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In situ measurement of slurry distribution

Optics: measuring and testing – For light transmission or absorption – Of fluent material
Reexamination Certificate

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In situ particle monitoring for defect reduction

Optics: measuring and testing – By particle light scattering – With photocell detection
Reexamination Certificate

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In situ particle size measuring device

Optics: measuring and testing – For size of particles – By particle light scattering
Patent

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In situ polarization mode dispersion measurement

Optics: measuring and testing – For optical fiber or waveguide inspection
Reexamination Certificate

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In situ process control system for steppers

Optics: measuring and testing – By polarized light examination – With birefringent element
Patent

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In situ proximity gap monitor for lithography

Optics: measuring and testing – Dimension
Reexamination Certificate

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In situ sensor for near wafer particle monitoring in semiconduct

Optics: measuring and testing – For size of particles – By particle light scattering
Patent

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In situ small particle diagnostics

Optics: measuring and testing – For size of particles – By particle light scattering
Patent

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In vitro determination of analyte levels within body fluids

Optics: measuring and testing – Blood analysis
Reexamination Certificate

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In vitro determination of analyte levels within body fluids

Optics: measuring and testing – Blood analysis
Reexamination Certificate

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In Vitro evaluation of animal or human lens characteristics

Optics: measuring and testing – Lens or reflective image former testing – Focal length measuring
Reexamination Certificate

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