Improvements in or relating to surface curvature measurement

Details Improvements in or relating to surface curvature measurement Improvements in or relating to surface curvature measurement

1994-11-29

1995-11-14

Rosenberger, Richard A.

Optics: measuring and testing

By polarized light examination

With light attenuation

356124, G01B 1504

Patent

active

054671922

ABSTRACT:
An apparatus for the measurement of the curvature of a surface includes at least one source of electromagnetic radiation, an electromagnetic radiation detector, and a lens positioned and arranged to focus source radiation reflected from the surface onto the detector. The detector is arranged to provide an output signal characteristic of a position thereon at which the radiation is incident. A signal processor, responsive to the output signal, provides an indication appertaining to curvature of the surface.

REFERENCES:
patent: 4289400 (1981-09-01), Kubota et al.
patent: 4332477 (1982-06-01), Sato
patent: 4390277 (1983-06-01), Quinn
patent: 4410267 (1983-10-01), Shindow et al.
patent: 4412743 (1983-11-01), Eberly
patent: 4425041 (1984-01-01), Nishiyama
patent: 4588270 (1986-05-01), Tamaki
patent: 5210592 (1993-05-01), Bretschneider
patent: 5251010 (1993-10-01), Maltby
Jenkins et al, Fundamentals of Optics, McGraw-Hill Book Company, copyright 1957, pp. 86-89.

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