Search
Selected: D

Decreasing the effects of linear birefringence in a...

Optics: measuring and testing – By light interference – Using fiber or waveguide interferometer
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Deep-UV led and laser fluorescence apparatus for monitoring...

Optics: measuring and testing – By dispersed light spectroscopy – With sample excitation
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Defect assessing apparatus and method, and semiconductor...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Defect classification using scattered light intensities

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Defect compensation of lithography on non-planar surface

Optics: measuring and testing – Focal position of light source
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Defect detecting apparatus

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Defect detecting method and apparatus

Optics: measuring and testing – By inspection with agitation or rotation – Of containers
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Defect detecting method and device

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Defect detecting method and device

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Defect detecting method and system

Optics: measuring and testing – Inspection of flaws or impurities – Containers or enclosures
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Defect detection and plotting system

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Defect detection in films on ceramic substrates

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Defect detection in pellicized reticles via exposure at...

Optics: measuring and testing – Inspection of flaws or impurities
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Defect detection lighting system and methods for large glass...

Optics: measuring and testing – Inspection of flaws or impurities – Transparent or translucent material
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Defect detection system

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Defect detection system

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Defect detection system

Optics: measuring and testing – Surface roughness
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Defect detection system

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Defect detection system

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Defect detection system

Optics: measuring and testing – Refraction testing – Prism engaging specimen
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0
  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.