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Darkfield defect inspection with spectral contents

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Darkfield inspection system having a programmable light...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Darkfield inspection system having a programmable light...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Darkfield inspection system having photodetector array

Optics: measuring and testing – Inspection of flaws or impurities
Reexamination Certificate

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Data acquisition system for spectrophotometer

Optics: measuring and testing – Range or remote distance finding – With photodetection
Patent

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Data age adjustments

Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate

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Data age compensation with avalanche photodiode

Optics: measuring and testing – By light interference – Having light beams of different frequencies
Reexamination Certificate

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Data aquisition system and method for a laser doppler...

Optics: measuring and testing – Velocity or velocity/height measuring – With light detector
Reexamination Certificate

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Data collection system and method for a flow cytometer

Optics: measuring and testing – By dispersed light spectroscopy – With sample excitation
Reexamination Certificate

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Data compression system for a photometer

Optics: measuring and testing – For light transmission or absorption – By comparison
Patent

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Data frame selection for cytometer analysis

Optics: measuring and testing – By particle light scattering
Reexamination Certificate

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Data processor and data processing method for wavemeter

Optics: measuring and testing – By light interference – Spectroscopy
Reexamination Certificate

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Data transmission system for a camera

Optics: measuring and testing – Range or remote distance finding – With photodetection
Patent

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Data transmission system for a camera

Optics: measuring and testing – Range or remote distance finding – With photodetection
Patent

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Datum sensing using optical grating

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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DC plasma jet generator for emission spectrochemical analysis

Optics: measuring and testing – By dispersed light spectroscopy – With sample excitation
Patent

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DC Shift error correction for electro-optical measuring system

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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De broglie microscope

Optics: measuring and testing – Inspection of flaws or impurities
Reexamination Certificate

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De-embedment of optical component characteristics and...

Optics: measuring and testing – By light interference – Using fiber or waveguide interferometer
Reexamination Certificate

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Dead reckoning optoelectronic intelligent docking system

Optics: measuring and testing – Range or remote distance finding – With photodetection
Patent

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