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Glass bottle inspection machine

Optics: measuring and testing – Inspection of flaws or impurities – Containers or enclosures
Patent

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Glass bottle inspection unit

Optics: measuring and testing – Inspection of flaws or impurities – Containers or enclosures
Patent

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Glass container inspection machine

Optics: measuring and testing – Inspection of flaws or impurities – Containers or enclosures
Patent

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Glass container inspection machine

Optics: measuring and testing – Inspection of flaws or impurities – Transparent or translucent material
Reexamination Certificate

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Glass flaw inspection system

Optics: measuring and testing – Inspection of flaws or impurities – Transparent or translucent material
Patent

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Glass inspection method and apparatus

Optics: measuring and testing – Inspection of flaws or impurities – Transparent or translucent material
Patent

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Glass substrate inspection apparatus

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Patent

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Golf ball indicia verification system

Optics: measuring and testing – Inspection of flaws or impurities
Reexamination Certificate

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Grain angle sensor

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Grooved surface defect detection apparatus

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions
Patent

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Gun barrel inspection mirror device

Optics: measuring and testing – Inspection of flaws or impurities – Bore inspection
Reexamination Certificate

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Head slap characterization using optical surface analyzer

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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High resolution electronic automatic imaging and inspecting syst

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions
Patent

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High resolution wafer inspection system

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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High sensitivity absorptiometer

Optics: measuring and testing – Inspection of flaws or impurities – Bore inspection
Patent

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High speed flaw detecting system for reflective material

Optics: measuring and testing – Inspection of flaws or impurities
Patent

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High throughput brightfield/darkfield wafer inspection...

Optics: measuring and testing – Inspection of flaws or impurities
Reexamination Certificate

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High throughput brightfield/darkfield wafer inspection...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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High throughput brightfield/darkfield wafer inspection...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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High throughput brightfield/darkfield wafer inspection...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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