Optics: measuring and testing – Inspection of flaws or impurities
Patent
1999-06-08
2000-08-01
Pham, Hoa Q.
Optics: measuring and testing
Inspection of flaws or impurities
3562373, 3562391, 250237R, G01N 2100
Patent
active
060974826
ABSTRACT:
An apparatus for the detection of surface flaws in material having a surface which is partially reflective includes at least one light source arranged to direct incident light on a surface of an at least partially reflective material, and a light detector disposed above the surface of the material. The light detector and the at least one light source are arranged relative to each other such that, in the absence of a surface flaw in the material, substantially no light from the at least one light source is detected by the light detector and, in the presence of a surface flaw in the material, light from the at least one light source is reflected off of the flaw and into the detector.
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Irvin Donald L.
Mullins Michael J.
Smith Barry Scott
Van Derlinden Roy E.
Pham Hoa Q.
Philip Morris Incorporated
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