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Image inspection apparatus and method

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions
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Image intensification for low light inspection

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
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Image pickup apparatus and defect inspection apparatus for...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
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Image pickup apparatus and defect inspection system for...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
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Image plane measurement method, exposure method, device...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
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Image scanning apparatus and method

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions
Patent

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Image-based fiber length measurements from tapered beards

Optics: measuring and testing – Inspection of flaws or impurities – Textile inspection
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Imaging method and apparatus

Optics: measuring and testing – Inspection of flaws or impurities – Transparent or translucent material
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Imaging semiconductor structures using solid state illumination

Optics: measuring and testing – Inspection of flaws or impurities
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Imaging sensor optical system

Optics: measuring and testing – Inspection of flaws or impurities – Bore inspection
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Imaging system

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
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Imaging system for robotically inspecting gas turbine...

Optics: measuring and testing – Inspection of flaws or impurities – Bore inspection
Reexamination Certificate

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In-line inspection system for vertically profiling plastic...

Optics: measuring and testing – Inspection of flaws or impurities – Transparent or translucent material
Reexamination Certificate

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In-line monitoring of silicide quality using non-destructive...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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In-process vision detection of flaws and FOD by back field...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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In-situ thickness measurement for use in semiconductor...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Inclusion detection

Optics: measuring and testing – Inspection of flaws or impurities – Transparent or translucent material
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Industrial viewing station for inspection of defects

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions
Patent

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Information recording medium examining apparatus and method

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Information recording medium examining apparatus and method

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
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