Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate
2008-07-22
2008-07-22
Stafira, Michael P (Department: 2886)
Optics: measuring and testing
Inspection of flaws or impurities
Surface condition
C356S237300
Reexamination Certificate
active
11248612
ABSTRACT:
In an examining apparatus, an electron gun irradiates an intended position of an information recording medium with an electron beam. A stage holds the information recording medium such that the information recording medium can be moved along a rotation direction and a radial direction. A detector detects electrons which have acquired information of a surface of the information recording medium by irradiating the information recording medium with the electron beam. An image producing unit acquires an image of the surface of the information recording medium based on the electrons detected by the detector. The examining apparatus can examine as to whether or not a defect of an information recording medium such as a CD and a DVD is present, but also can examine a shape of the defect thereof. The examining apparatus can also examine an information recording medium having a large storage capacity.
REFERENCES:
patent: 5389794 (1995-02-01), Allen et al.
patent: 6936816 (2005-08-01), Mankos et al.
patent: 9-54952 (1997-02-01), None
patent: 2004-55119 (2004-02-01), None
Noji Nobuharu
Tohyama Keiichi
Yoshikawa Shoji
Ebara Corporation
Stafira Michael P
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