Optics: measuring and testing – Inspection of flaws or impurities – Bore inspection
Reexamination Certificate
2007-05-01
2007-05-01
Pham, Hoa Q. (Department: 2877)
Optics: measuring and testing
Inspection of flaws or impurities
Bore inspection
C250S269100, C250S260000, C250S258000
Reexamination Certificate
active
10763735
ABSTRACT:
The present invention relates to an in-vessel or down-hole optical imaging sensor or system for operating in structures which may contain media with different spectral transmission characteristics. The imaging sensor of the present invention selectively emits and/or detects two or more independently controllable wavelengths or wavebands. The imaging sensor comprises an illuminator for emitting radiation of a specified wavelength or waveband through a medium to a target, at least one detector for detecting the radiation deflected by said target and at least one amplifier for providing non-linear amplification of the detector output.
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Cockshott Robert Alexander
Hother John Anthony
Blakely & Sokoloff, Taylor & Zafman
De Klerk Stephen M.
Pham Hoa Q.
Proneta Limited
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