Optics: measuring and testing – Inspection of flaws or impurities – Transparent or translucent material
Reexamination Certificate
2011-04-12
2011-04-12
Geisel, Kara E (Department: 2877)
Optics: measuring and testing
Inspection of flaws or impurities
Transparent or translucent material
C250S22300B
Reexamination Certificate
active
07924421
ABSTRACT:
Systems and methods for in-line inspection of plastic blow molded containers. The inspection system may comprise a plurality of emitter assemblies arranged in a vertical array. Each emitter assembly may cyclically emit light energy in at least two different narrow wavelength bands at a container as the container passes through an inspection area. The system may also comprise a plurality of broadband photodetectors arranged in a vertical array, each photodetector facing at least one of the emitter assemblies with the inspection area therebetween such that the photodetectors are capable of sensing light energy that passes through the container when it is in the inspection area. The system may also comprise a processor in communication with the photodetectors for determining a characteristic of the container based on signals from the photodetectors.
REFERENCES:
patent: 3439178 (1969-04-01), Rottmann
patent: 3456788 (1969-07-01), Stapf et al.
patent: 3729632 (1973-04-01), Cho et al.
patent: 3827812 (1974-08-01), Heimann
patent: 3923158 (1975-12-01), Forn{dot over (a)}{dot over (a)}
patent: 3980890 (1976-09-01), Heckrodt et al.
patent: 4304995 (1981-12-01), Huttunen et al.
patent: 4332606 (1982-06-01), Gardner
patent: 4393305 (1983-07-01), Shimizu et al.
patent: 4476533 (1984-10-01), Daudt et al.
patent: 4490612 (1984-12-01), Törmälä
patent: 4639263 (1987-01-01), Kulikauskas
patent: 4691830 (1987-09-01), Ahl et al.
patent: 4762544 (1988-08-01), Davey
patent: 5139406 (1992-08-01), Hoshino et al.
patent: 5323229 (1994-06-01), May et al.
patent: 5437702 (1995-08-01), Burns et al.
patent: 5591462 (1997-01-01), Darling et al.
patent: 5784157 (1998-07-01), Gorfinkel et al.
patent: 6705528 (2004-03-01), Good et al.
patent: 6753527 (2004-06-01), Yamagishi et al.
patent: 6863860 (2005-03-01), Birckbichler et al.
patent: 6872895 (2005-03-01), Cochran et al.
patent: 6962670 (2005-11-01), Hanson et al.
patent: 6967716 (2005-11-01), Cochran et al.
patent: 6985221 (2006-01-01), Semersky et al.
patent: 7374713 (2008-05-01), Birckbichler et al.
patent: 7378047 (2008-05-01), Birckbichler et al.
patent: 2001/0054680 (2001-12-01), Lindner
patent: 2003/0223086 (2003-12-01), Semersky et al.
patent: 2004/0091011 (2004-05-01), Liu
patent: 2004/0107065 (2004-06-01), Al-Ali
patent: 2005/0127572 (2005-06-01), Birckbichler et al.
patent: 2006/0126060 (2006-06-01), Colle et al.
patent: 2008/0197542 (2008-08-01), Birckbichler et al.
patent: 3611536 (1987-10-01), None
patent: 0348524 (1990-01-01), None
patent: WO 01/65204 (2001-09-01), None
International Search Report, PCT Application No. PCT/US2007/019230 dated Mar. 19, 2008 (3 pages).
International Preliminary Examination Report mailed Feb. 1, 2010 in corresponding International Application No. PCT/US07/19230.
AGR-TOPWAVE, LLC, Pet Wall, pp. 1-2, Butler, PA, USA.
AGR-TOPWAVE, LLC, Profiler Guage PG 9800, pp. 1-4, Butler, PA USA.
Zarnick, K., “100% On-Line Inspectino for the Pet Container-Industry”, SPE Conference/Plastics West, Las Vegas, NV, Oct. 4, 1990 and SPE Conference, Belin, Germany, Oct. 22-25, 1990, pp. 1-7, Figs. 1-7 (18 pages total).
Puvak, R., “Improving Production Performance of PET Containers through the use of On-Line Inspection Systems”, pp. 1-8, Figures 1-8 (19 pages total).
Tormala, S., “High Performance Plastic Packaging”, Society fo Plastics Engineers International, Oct. 31-Nov. 1, 1989, pp. 1-8, 8 tests.
Adolfs, F., ESPRIT, KB-MUSICA (2671), plas. 140.KRP.1, Sep. 19, 1989, pp. 1-10, Figs. 1-5.
Puvak, R., Improving PET Production Efficiencies via on-Line Inspection and Rejection fo Defective Preforms and Finished Containers, pp. 1-10, Figs. 1-8.
Schmidt William E.
Wolfe Georg V.
AGR International, Inc.
Geisel Kara E
K&L Gates LLP
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