Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1992-06-30
1993-12-07
Turner, Samuel A.
Optics: measuring and testing
By particle light scattering
With photocell detection
356349, 356352, 25022719, G41B 902
Patent
active
052687384
ABSTRACT:
An improved optical low-coherence reflectometer is disclosed for use in measuring the strength and location of optical reflections. The invention utilizes a reference signal comprising multiple copies of a light signal to increase the range of distance measurements over which the reflectometer operates. Each copy of the light signal is delayed by a different amount. Embodiments in which the copies are generated with a ring resonator, a Fabry-Perot cavity, and multiple fiber delay lines are described.
REFERENCES:
patent: 5231611 (1993-07-01), Laznicka, Jr.
"Optical Coherence-Domain Reflectometry: A New Optical Evaluation Technique", Robert C. Youngquist, Sally Carr, and D. E. N. Davies, Optics Letters, vol. 12, No. 3, Mar. 1987.
"New Measurement System for Fault Location in Optical Waveguide Devices Based on an Interferometric Technique", Kazumasa Takada, Itaru Yokohama, Kazumori Chida, and Juichi Noda, Applied Optics, vol. 26, No. 9, May 1, 1987.
"Guided-Wave Refelectometry With Micrometer Resolution", B. L. Danielson and C. D. Whittenberg, Applied Optics, vol. 26, No. 14, Jul. 15, 1987.
Baney Douglas M.
Sorin Wayne V.
Hewlett--Packard Company
Kim Robert
Turner Samuel A.
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