Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1997-11-07
2000-01-18
Kim, Robert H.
Optics: measuring and testing
By particle light scattering
With photocell detection
385 2, 385 3, G01B 902
Patent
active
060161981
ABSTRACT:
A Mach-Zehnder interferometer has electrodes configured to act as a microe transmission line. The optical waveguide arms have a reflective coating on their distal ends so that light is reflected back through the arms. The microwave transmission line is open-ended in a vicinity of the reflective coating so that microwave energy is reflected at the open end. Thus, the interferometer supports a traveling wave in a reflective configuration, and the distance over which interaction takes place can be effectively doubled.
REFERENCES:
patent: 5416859 (1995-05-01), Burns et al.
patent: 5886807 (1999-03-01), Cummings
Burns William K.
Moeller Robert P.
Edelberg Barry A.
Kim Robert H.
Lee Andrew H.
Miles Edward F.
The United States of America as represented by the Secretary of
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