Emission spectral width measuring apparatus for light source

Optics: measuring and testing – By particle light scattering – With photocell detection

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356346, 356349, G01B 902

Patent

active

049184911

ABSTRACT:
A measurement beam emitted from a laser diode is split into two beams by a beam splitter, and one of the two beams is guided to a first port of an acoustic optical element. When a high-frequency signal is applied from a diffraction controller to a piezoelectric transducer, the split beam input into the acoustic optical element from the first port is diffracted and frequency-shifted and output from a second port. If the high-frequency signal is not applied, the input beam rectilinearly propagates without diffracting and is output from a third port. This output beam is guided to a fourth port through an optical fiber. The beam input from the fourth port rectilinearly propagates and is output from the second port. The beam output from the second port is mixed with the other measurement beams split by the beam splitter to be converted to an electrical signal. The electrical signal is analyzed by a spectrum analyzer. When the high-frequency signal is applied to the piezoelectric transducer, measurement using optical heterodyne spectroscopy is performed, and when the high-frequency signal is not applied, measurement using optical homodyne spectroscopy is performed.

REFERENCES:
patent: 4790655 (1988-12-01), Yamamoto et al.
Novel Method for High Resolution Measurement of Laser Output Spectrum, Electronics Letters; Jul. 31, 1980, vol. 16, No. 16, pp. 630-631.

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