Search
Selected: All

Process and device for measuring the complex spectrum (amplitude

Optics: measuring and testing – By light interference – Spectroscopy
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Process monitor

Optics: measuring and testing – By light interference – Spectroscopy
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Real time high speed high resolution hyper-spectral imaging

Optics: measuring and testing – By light interference – Spectroscopy
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Reference fringe counting fourier transform spectroscopy

Optics: measuring and testing – By light interference – Spectroscopy
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Restoration of Fizeau FTS spectral data using low and/or...

Optics: measuring and testing – By light interference – Spectroscopy
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Robust wavelength locker for control of laser wavelength

Optics: measuring and testing – By light interference – Spectroscopy
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Sagnac fourier transform spectrometer having improved...

Optics: measuring and testing – By light interference – Spectroscopy
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Sagnac fourier transform spectrometer having improved...

Optics: measuring and testing – By light interference – Spectroscopy
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Sampling spectrophotometer comprising an interferometer

Optics: measuring and testing – By light interference – Spectroscopy
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Scanning double-beam interferometer

Optics: measuring and testing – By light interference – Spectroscopy
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Scanning IR microscope

Optics: measuring and testing – By light interference – Spectroscopy
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Scatterometry by phase sensitive reflectometer

Optics: measuring and testing – By light interference – Spectroscopy
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Scatterometry by phase sensitive reflectometer

Optics: measuring and testing – By light interference – Spectroscopy
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Self-calibrating measuring setup for interference spectroscopy

Optics: measuring and testing – By light interference – Spectroscopy
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Signal modulation compensation for wavelength meter

Optics: measuring and testing – By light interference – Spectroscopy
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Single-etalon, multi-point wavelength calibration reference

Optics: measuring and testing – By light interference – Spectroscopy
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Spatial heterodyne wide-field Coherent Anti-Stokes Raman...

Optics: measuring and testing – By light interference – Spectroscopy
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Spectral bandwidth metrology for high repetition rate gas...

Optics: measuring and testing – By light interference – Spectroscopy
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Spectral bandwidth metrology for high repetition rate gas...

Optics: measuring and testing – By light interference – Spectroscopy
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Spectral image input device

Optics: measuring and testing – By light interference – Spectroscopy
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0
  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.