Optics: measuring and testing – By light interference – Spectroscopy
Reexamination Certificate
2006-10-18
2008-10-14
Lee (Andrew), Hwa S (Department: 2886)
Optics: measuring and testing
By light interference
Spectroscopy
Reexamination Certificate
active
07436518
ABSTRACT:
A Fourier Transform Spectrometer (“FTS”) system includes a Fizeau FTS having a plurality of sub-collecting elements, adjacent ones of which are separated by a gap distance, and at least one of which has an adjustable optical path. The FTS system further includes a Michelson FTS having an adjustable optical path. The FTS system further includes one or more processors configured to select spectral data collected by the Fizeau FTS corresponding to spatial frequencies for which the Fizeau FTS has a modulation transfer function (“MTF”) value above a first threshold level, to select spectral data collected by the Michelson FTS corresponding to spatial frequencies for which the Michelson FTS has a MTF value above a second threshold level, and to combine the selected spectral data from the Fizeau FTS with the selected spectral data from the Michelson FTS.
REFERENCES:
patent: 5159489 (1992-10-01), Massie et al.
patent: 7034945 (2006-04-01), Kendrick et al.
patent: 7092103 (2006-08-01), Kendrick et al.
patent: 7119955 (2006-10-01), Sigler et al.
patent: WO-2004-011963 (2004-02-01), None
Kendrick Richard L.
Smith Eric H.
Lee (Andrew) Hwa S
Lockheed Martin Corporation
McDermott Will & Emery LLP
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