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Integrated tunable optical sensor (ITOS) system

Optics: measuring and testing – By dispersed light spectroscopy – With raman type light scattering
Reexamination Certificate

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Integrated-optic spectrometer and method

Optics: measuring and testing – By dispersed light spectroscopy – For spectrographic investigation
Reexamination Certificate

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Integrated-photocircuit interferometer

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

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Interface configuration for rate sensor apparatus

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

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Interference apparatus for detecting state of wave surface

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

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Interference apparatus for measuring absolute and differential m

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

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Interference sensor and method utilizing extracted alliasing fre

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

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Interference spectrometer with a moving mirror

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

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Interferential linear and angular displacement apparatus having

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

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Interferential measurement device for at least one direction of

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

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Interferential position measuring device

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

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Interferometer

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

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Interferometer and method for measuring the distance of an objec

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

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Interferometer apparatus and method for determining the spatial

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

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Interferometer apparatus for microtopography

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

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Interferometer delay line with an optical payload supported by a

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

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Interferometer for determining the position of displacement trav

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

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Interferometer for in situ measurement of thin film thickness ch

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

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Interferometer for measuring a surface configuration of a test o

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

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Interferometer for measuring thickness variations of semiconduct

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

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