Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent
1991-12-20
1993-06-15
Turner, Samuel A.
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
356359, 356358, 356360, 356445, 356381, 156626, G01B 1102
Patent
active
052204057
ABSTRACT:
An interferometer 10 for measuring the position of the process surface 21 of a substrate 20 includes a coherent light source 12 for providing a light beam 14 which is partially transmitted and partially reflected by a beam splitter 16. The reflected light beam 18 is reflected off of the process surface 21 and the transmitted light beam 30 is reflected off of a translator 32 which vibrates a predetermined distance at a predetermined frequency. The phase shift between the light beams 22, 31 reflected off of translator 32 and the process surface 21 is measured using a photodetector 24, which provides an output signal 26 to a feedback servo unit 28. The servo unit 28 provides an output signal 38 which controls the vibration of translator 32. The output signal 38 of servo unit 28 is also indicative of the position of the process surface 21.
REFERENCES:
patent: 3612692 (1971-10-01), Kruppa et al.
patent: 3744916 (1973-07-01), Bey et al.
patent: 4141780 (1979-02-01), Kleinknecht
patent: 4147435 (1979-04-01), Habegger
patent: 4203799 (1980-05-01), Sugawara et al.
patent: 4367044 (1983-01-01), Booth, Jr.
patent: 4422764 (1983-12-01), Eastman
patent: 4443106 (1984-04-01), Yasuda et al.
Handbook of Thin Film Technology edited by Leon I. Maissel and Reinhard Glang, McGraw-Hill Book Company, 11-11.
L. Peters, "Techniques for Measuring Metal Films," Semiconductor International, Jun. 1991, p. 81.
IBM Technical Disclosure Bulletin, vol. 25, No. 10, Mar. 1983 "Interferometer for In Situ Measuring Etch and Deposition Rates" by H. Stein.
Temperature measurements of glass substrates during plasma etching-R. A. Bond et al.; Journal of Vacuum Science Technology; vol. 18, No. 2, Mar. 1991, pp. 335-338.
Barbee Steven G.
Li Leping
Silvestri Victor J.
Balconi-Lamica Michael J.
International Business Machines - Corporation
Keesee La Charles
Romanchik Richard A.
Turner Samuel A.
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