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Scanning probe microscope and scanning method

Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate

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Scanning probe microscope and specimen observation method...

Measuring and testing – Surface and cutting edge testing – Roughness
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Scanning probe microscope displacement detecting mechanism...

Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate

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Scanning probe microscope fine-movement mechanism and...

Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate

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Scanning probe microscope for ultra sensitive...

Measuring and testing – Surface and cutting edge testing – Roughness
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Scanning probe microscope having a cantilever used therein

Measuring and testing – Surface and cutting edge testing – Roughness
Patent

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Scanning probe microscope having cantilever attached to driving

Measuring and testing – Surface and cutting edge testing – Roughness
Patent

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Scanning probe microscope having piezoelectric member for...

Measuring and testing – Surface and cutting edge testing – Roughness
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Scanning probe microscope head with signal processing circuit

Measuring and testing – Surface and cutting edge testing – Roughness
Patent

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Scanning probe microscope incorporating an optical microscope

Measuring and testing – Surface and cutting edge testing – Roughness
Patent

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Scanning probe microscope incorporating an optical microscope

Measuring and testing – Surface and cutting edge testing – Roughness
Patent

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Scanning probe microscope system including removable probe senso

Measuring and testing – Surface and cutting edge testing – Roughness
Patent

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Scanning probe microscope system including removable probe...

Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate

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Scanning probe microscope with improved probe head mount

Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate

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Scanning probe microscope with improved probe tip mount

Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate

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Scanning probe microscope, molecular processing method using the

Measuring and testing – Surface and cutting edge testing – Roughness
Patent

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Scanning probe microscopy apparatus and techniques

Measuring and testing – Testing of material
Reexamination Certificate

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Scanning probe system with spring probe

Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate

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Scanning pyrometer

Measuring and testing – Gas analysis – Moisture content or vapor pressure
Patent

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Scanning pyrometer system

Measuring and testing – Gas analysis – Moisture content or vapor pressure
Patent

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