4. Image analysis
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OVD (optical variable device) inspection method and...

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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Over-range image artifact reduction in tomographic imaging

Image analysis – Histogram processing – For setting a threshold
Patent

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Overflow error diffusion

Image analysis – Image compression or coding – Gray level to binary coding
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Overlaid graphical user interface and method for image...

Image analysis – Color image processing
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Overlapped reversible transforms for unified lossless/lossy comp

Image analysis – Image compression or coding – Transform coding
Patent

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Overlapped reversible transforms for unified lossless/lossy...

Image analysis – Image compression or coding – Transform coding
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Overlay accuracy measuring method

Image analysis – Applications – Manufacturing or product inspection
Patent

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Overlay marks, methods of overlay mark design and methods of...

Image analysis – Applications – Manufacturing or product inspection
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Overlay marks, methods of overlay mark design and methods of...

Image analysis – Applications – Manufacturing or product inspection
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Overlay marks, methods of overlay mark design and methods of...

Image analysis – Applications – Manufacturing or product inspection
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Overlay marks, methods of overlay mark design and methods of...

Image analysis – Applications – Manufacturing or product inspection
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Overlay marks, methods of overlay mark design and methods of...

Image analysis – Applications – Manufacturing or product inspection
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Overlay marks, methods of overlay mark design and methods of...

Image analysis – Applications – Manufacturing or product inspection
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Overlay marks, methods of overlay mark design and methods of...

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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Overlay of tinted images for visualizing change in serial...

Image analysis – Applications – Biomedical applications
Reexamination Certificate

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Overlay vernier pattern for measuring multi-layer overlay...

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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Overlay vernier pattern for measuring multi-layer overlay...

Image analysis – Applications – Manufacturing or product inspection
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Ownership tagging and data assurance of image data system...

Image analysis – Image transformation or preprocessing – Image storage or retrieval
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