OVD (optical variable device) inspection method and...

Details OVD (optical variable device) inspection method and... OVD (optical variable device) inspection method and...

2005-09-06

2011-10-18

Repko, Jason M (Department: 2624)

Image analysis

Applications

Manufacturing or product inspection

C382S100000, C382S141000, C358S001140, C283S088000

Reexamination Certificate

active

08041107

ABSTRACT:
A method and apparatus for inspecting defects and attachment position of an attached OVD without any influence of a change in the pattern of the OVD due to fluttering or undulation during conveyance of the printed product. Image input means and illumination means are arranged at positions where mirror reflected light and diffracted light from the OVD have values equal to or less than a threshold value upon a binarization process by image processing means. The image processing means executes the binarization process, compares the image data with the reference image data or the image data with the reference image data and the data indicating the reference position, and determines the acceptability of at least one of the form, area, and position of the OVD attached to the base material on the basis of a comparison result.

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