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Single event upset resilient programmable interconnect

Electronic digital logic circuitry – Reliability – Parasitic prevention in integrated circuit structure
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Soft error detection for latches

Electronic digital logic circuitry – Reliability
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Soft error upset hardened integrated circuit systems and...

Electronic digital logic circuitry – Reliability – Fail-safe
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Soft error upset hardened integrated circuit systems and...

Electronic digital logic circuitry – Reliability – Fail-safe
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Speedpath repair in an integrated circuit

Electronic digital logic circuitry – Reliability – Redundant
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Structure and method of repair of integrated circuits

Electronic digital logic circuitry – Reliability – Redundant
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Structure and method of repair of integrated circuits

Electronic digital logic circuitry – Reliability – Redundant
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System and method for creating replacements for obsolete...

Electronic digital logic circuitry – Reliability – Redundant
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System and method for providing capacitive spare fill cells...

Electronic digital logic circuitry – Reliability – Redundant
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System monitor in a programmable logic device

Electronic digital logic circuitry – Reliability
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System monitor in a programmable logic device

Electronic digital logic circuitry – Reliability
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System monitor in a programmable logic device

Electronic digital logic circuitry – Reliability
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