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Voltage measuring apparatus and power measuring apparatus

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
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Voltage probe

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
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Voltage sensing device and associated method

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Distributive type parameters
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Voltage sensor and dielectric material

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
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Voltage stand off characteristics of photoconductor devices

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
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Voltage-impressed current measuring apparatus and current...

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
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Voltage-impressed current measuring apparatus and current...

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
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Volume charge density measuring system

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
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Volume charge density measuring system

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
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Volume charge density measuring system

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
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VSWR-measurement with error compensation

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Distributive type parameters
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Wafer dicing system

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
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Wafer edge-defect detection and capacitive probe therefor

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
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Wafer level reliability contact test structure and method

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent

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Wafer scale high density probe assembly, apparatus for use...

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
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Wafer-to-wafer alignments

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
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Wafer-to-wafer alignments

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
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Water contamination sensing algorithms for ethanol...

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
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Water content metering apparatus

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Utility Patent

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Water immersion detecting circuit

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
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