Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1994-06-23
1996-04-16
Regan, Maura K.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
2502141, G01R 2708
Patent
active
055086250
ABSTRACT:
The invention provides a way to improve the voltage stand-off characteristics of photoconductors, including both surface and bulk photoconductors. In a preferred embodiment, the invention comprises a photoconductor device having a semiconductor substrate with electrodes thereon, and a light source which illuminates the surface of the device in a pattern which is configured to increase the stand-off voltage of the device. A method according to the invention includes the steps of directing light onto the surface of the photoconductor thereby forming an illuminated area thereon, measuring the current draw of the photoconductor, and moving the illuminated area along the surface of the photoconductor until the current draw is minimized.
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Redman Mary Y.
Regan Maura K.
The Boeing Company
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