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Method and system for multi-frequency inductive ratio...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – For fault location
Reexamination Certificate

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Method and system for multi-frequency inductive ratio...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – For fault location
Reexamination Certificate

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Method and system for multi-port synchronous high voltage...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of electrically operated apparatus
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Method and system for passively detecting and locating wire...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – For fault location
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Method and system for performing time domain reflectometry...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – For fault location
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Method and system for probing, testing, burn-in, repairing...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Method and system for processing integrated circuits

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Method and system for producing signals to test...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Method and system for providing an automated switching box...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Method and system for screening reliability of semiconductor cir

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Method and system for screening reliability of semiconductor cir

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Method and system for selectively disconnecting a redundant...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Method and system for sensor fault detection

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Instruments and devices for fault testing
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Method and system for stressing semiconductor wafers during...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Method and system for testing a semiconductor memory device

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Method and system for testing a signal path having an...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – For fault location
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Method and system for testing an electrical component

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Method and system for testing an electronic module mounted on a

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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Method and system for testing an integrated circuit input...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Method and system for testing an interconnection in a semiconduc

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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