Method and system for producing signals to test...

Details Method and system for producing signals to test... Method and system for producing signals to test...

2006-11-14

2006-11-14

Tang, Minh N. (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S073100, C324S1540PB

Reexamination Certificate

active

07135881

ABSTRACT:
A method of and system for producing signals to test semiconductor devices includes a pin electronic (PE) stage for providing a parametric measurement unit (PMU) current test signal to a semiconductor device under test. The PE stage also senses a response from the semiconductor device under test.

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