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Substrate for a probe card having conductive layers for...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Substrate for inspecting electronic device, method of...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Substrate having self limiting contacts for establishing an elec

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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Substrate impedance measurement

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Substrate impedance measurement

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Substrate inspection device and substrate inspecting method

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Substrate inspection using the propagation characteristics...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Substrate surface potential measuring apparatus and plasma equip

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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Substrate test apparatus and method of testing substrates

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Substrate tester having shorting pad actuator method and apparat

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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Substrate tester location clamping, sensing, and contacting meth

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Substrate testing apparatus and substrate testing method

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Substrate with patterned conductive layer

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Suction cap for IC sockets and IC socket assembly using same

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Super-voltage circuit with a fast reset

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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Super-voltage circuit with a fast reset

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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Supply current based testing of CMOS output stages

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Supply voltage level detector

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Support for a receptacle block of a unit under test

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Support member assembly for electroconductive contact members

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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