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Temperature-compensated interface circuit between "OR-tied" conn

Electrical transmission or interconnection systems – Nonlinear reactor systems – Parametrons
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Temperature-compensated logarithmic detector having a wide dynam

Electrical transmission or interconnection systems – Nonlinear reactor systems – Parametrons
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Temperature-compensated voltage driver circuit for a current sou

Electrical transmission or interconnection systems – Nonlinear reactor systems – Parametrons
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Temperature-independent exponential converter

Electrical transmission or interconnection systems – Nonlinear reactor systems – Parametrons
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Temperature-independent gain control circuit

Electrical transmission or interconnection systems – Nonlinear reactor systems – Parametrons
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Terminal convertible alternating current switch

Electrical transmission or interconnection systems – Nonlinear reactor systems – Parametrons
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Termination circuit

Electrical transmission or interconnection systems – Nonlinear reactor systems – Parametrons
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Terminator current driver with short-circuit protection

Electrical transmission or interconnection systems – Nonlinear reactor systems – Parametrons
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Ternary logic circuits with CMOS integrated circuits

Electrical transmission or interconnection systems – Nonlinear reactor systems – Parametrons
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Ternary signal multiplexor circuit

Electrical transmission or interconnection systems – Nonlinear reactor systems – Parametrons
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Test flip-flop with an auxillary latch enabling two (2) bits of

Electrical transmission or interconnection systems – Nonlinear reactor systems – Parametrons
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Test period generator for automatic test equipment

Electrical transmission or interconnection systems – Nonlinear reactor systems – Parametrons
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Testable latch self checker

Electrical transmission or interconnection systems – Nonlinear reactor systems – Parametrons
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Testable passgate logic circuits

Electrical transmission or interconnection systems – Nonlinear reactor systems – Parametrons
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Testable protective system

Electrical transmission or interconnection systems – Nonlinear reactor systems – Parametrons
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Testable redundancy decoder of an integrated semiconductor memor

Electrical transmission or interconnection systems – Nonlinear reactor systems – Parametrons
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Testing apparatus and diagnostic method for use with programmabl

Electrical transmission or interconnection systems – Nonlinear reactor systems – Parametrons
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Testing programmable logic arrays

Electrical transmission or interconnection systems – Nonlinear reactor systems – Parametrons
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Testing programmable logic arrays

Electrical transmission or interconnection systems – Nonlinear reactor systems – Parametrons
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Thermosensitive semiconductor device using Darlington circuit

Electrical transmission or interconnection systems – Nonlinear reactor systems – Parametrons
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