LandOfFree - US Patents - Listing for Data processing: measuring, calibrating, or testing

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Method for verifying scan precision of a laser measurement...

Data processing: measuring – calibrating – or testing – Measurement system – Orientation or position

Reexamination Certificate

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Method for verifying sensors installation and determining...

Data processing: measuring – calibrating – or testing – Testing system – Of sensing device

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Method for verifying the calculator core of a microprocessor...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system

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Method for vibrator sweep analysis and synthesis

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Earth science

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Method for virtual inspection of virtually machined parts

Data processing: measuring – calibrating – or testing – Testing system – Of mechanical system

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Method for virtual inspection of virtually machined parts

Data processing: measuring – calibrating – or testing – Testing system – Of mechanical system

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Method for visualizing large-scale protein interaction data

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Biological or biochemical

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Method for weighing vehicles crossing a bridge

Data processing: measuring – calibrating – or testing – Measurement system – Weight

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Method for weighting a seat profile

Data processing: measuring – calibrating – or testing – Measurement system – Weight

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Method for wire guidance tone certification

Data processing: measuring – calibrating – or testing – Measurement system – Time duration or rate

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Method for zero correction of a measuring device

Data processing: measuring – calibrating – or testing – Calibration or correction system – Zeroing

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Method in a performance monitor for sampling all performance...

Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation

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Method in an integrated circuit (IC) manufacturing process for i

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

Patent

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Method in an integrated circuit (IC) manufacturing process for i

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

Patent

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