Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2006-12-26
2006-12-26
Assouad, Patrick J. (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S117000, C702S119000, C714S025000, C714S030000, C714S031000, C714S036000, C714S733000, C714S734000
Reexamination Certificate
active
07155351
ABSTRACT:
A method for checking a microprocessor for correct operation, the microprocessor having a plurality of gates, each having a plurality of transistors, in which during the intended running of a computer program on the microprocessor a self-test is cyclically executed, and as part of the self-test, gates in the microprocessor are checked for correct operation. In order to check the microprocessor for correct operation in such a way that the functional check is able to detect at an early stage such errors which occur only during the intended operation of the microprocessor, and to the extent possible not to make use of models of the open-loop or closed-loop control algorithms, at least those gates of the microprocessor whose state has an impact on the intended running of the computer program on the microprocessor are checked during one run of the self-test.
REFERENCES:
patent: 5195095 (1993-03-01), Shah
patent: 5732209 (1998-03-01), Vigil et al.
patent: 5937154 (1999-08-01), Tegethoff
patent: 5963566 (1999-10-01), Rajsuman et al.
patent: 5991898 (1999-11-01), Rajski et al.
patent: 6408413 (2002-06-01), Whetsel
patent: 6701476 (2004-03-01), Pouya et al.
patent: 6728901 (2004-04-01), Rajski et al.
patent: 6948096 (2005-09-01), Parvathala et al.
patent: 6954888 (2005-10-01), Rajski et al.
patent: 2002/0184582 (2002-12-01), Pouya et al.
patent: 2003/0131296 (2003-07-01), Park et al.
patent: 2003/0167144 (2003-09-01), Wang et al.
patent: 2004/0006729 (2004-01-01), Pendurkar
patent: 2005/0050387 (2005-03-01), Mariani et al.
patent: 2005/0060626 (2005-03-01), Rajski et al.
patent: 2006/0020411 (2006-01-01), Gedamu et al.
patent: 2006/0020442 (2006-01-01), Gedamu et al.
patent: 2006/0026478 (2006-02-01), Gedamu et al.
patent: 2006/0031789 (2006-02-01), Gedamu et al.
patent: 37 37 713 (1989-05-01), None
patent: 3790186 (1992-12-01), None
patent: 4139151 (1993-06-01), None
patent: 4305288 (1994-08-01), None
patent: 19500188 (1996-07-01), None
Bernardi et al., “Using Infrastructure IPs to Support SW-based Self-Test of Processor Cores”, IEEE, 2004.
Kranitis et al., “Effective Software Self-Test Methodology for Processor Cores”, IEEE, 2002.
Radecka et al., “Arithmetic Built-In Self-Test for DSP Cores”, IEEE, 1997.
Krstic et al., “Embedded Software-Based Self-Test for Programmable Core-Based Designs”, IEEE, 2002.
Chen et al., “Software-Based Self-Testing Methodology for Processor Cores”, IEEE, 2001.
Chen et al., “Embedded Hardware and Software Self-Testing Methodologies for Processor Cores”, IEEE, 2000.
Kranitis et al., “Instruction-Based Self-Testing of Processor Cores”, IEEE, 2002.
Jayaraman et al., “Native Mode Functional Self-Test Generation for Systems-on-Chip”, IEEE, 2002.
Böhl, E. et al., “The Fail-Stop Controller AE 11”, International Test Conference, Paper 24.1, pp. 567 to 577, 0-7803-4209-7/97, 1997 IEEE.
“Design & Elektronik Mikrocontroller und DSPs”, Oct. 1999, Seite 76.
Harter Werner
Hering Michael
Mattern Klaus-Peter
Assouad Patrick J.
Kenyon & Kenyon LLP
Robert & Bosch GmbH
LandOfFree
Method for verifying the calculator core of a microprocessor... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method for verifying the calculator core of a microprocessor..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for verifying the calculator core of a microprocessor... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3692832