Method for verifying scan precision of a laser measurement...

Details Method for verifying scan precision of a laser measurement... Method for verifying scan precision of a laser measurement...

2006-03-16

2008-10-07

Stafira, Michael P (Department: 2886)

Data processing: measuring, calibrating, or testing

Measurement system

Orientation or position

C702S152000

Reexamination Certificate

active

07433797

ABSTRACT:
A method for verifying scan precision of a laser measurement machine includes the steps of: preparing a standardized 3D profile model; determining an ideal curved surface as a conventional true value of the standardized 3D profile model; scanning the standardized 3D profile model by the laser measurement machine and obtaining point cloud data; calculating a bias between each point in the point cloud and the ideal curved surface; evaluating the veracity of the laser measurement machine by using the largest bias; and evaluating the receptiveness of the laser measurement machine.

REFERENCES:
patent: 7047151 (2006-05-01), Chang
patent: 7228254 (2007-06-01), Numata et al.
patent: 2001/0024309 (2001-09-01), Shim
patent: WO 2004/051179 (2004-06-01), None

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