LandOfFree - US Patents - Listing for Data processing: measuring, calibrating, or testing

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Parameter setting method and circuit operation testing...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system

Reexamination Certificate

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Parameters calibrating system and method for optical disc drive

Data processing: measuring – calibrating – or testing – Calibration or correction system

Reexamination Certificate

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Parametric device signature

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

Reexamination Certificate

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Parametric fk techniques for seismic applications

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Earth science

Reexamination Certificate

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Parametric modeling of well log data to remove periodic errors

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Earth science

Patent

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Parametric outlier detection

Data processing: measuring – calibrating – or testing – Measurement system – Measured signal processing

Reexamination Certificate

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Parametrically disciplined operation of a vibratory gyroscope

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system

Reexamination Certificate

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Parcel networks

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment

Reexamination Certificate

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Parking lot pavement analysis system

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Mechanical measurement system

Reexamination Certificate

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Part measurement prioritization system and method

Data processing: measuring – calibrating – or testing – Measurement system – Dimensional determination

Reexamination Certificate

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Partial discharge monitoring apparatus and partial discharge...

Data processing: measuring – calibrating – or testing – Measurement system – Remote supervisory monitoring

Reexamination Certificate

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Partial discharge site location system for determining the posit

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system

Patent

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Particle analyzer and particle classifying method

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Chemical analysis

Reexamination Certificate

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Particle sampling method and sensor fusion and filtering method

Data processing: measuring – calibrating – or testing – Measurement system – Statistical measurement

Reexamination Certificate

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Particle sampling method and sensor fusion and filtering method

Data processing: measuring – calibrating – or testing – Measurement system – Statistical measurement

Reexamination Certificate

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Particle sizing refinement system

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Chemical analysis

Reexamination Certificate

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Particulate compositions

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Chemical analysis

Reexamination Certificate

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Particulate determination method

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Chemical analysis

Reexamination Certificate

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Particulate determination method

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Chemical analysis

Reexamination Certificate

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Parts identifying method

Data processing: measuring – calibrating – or testing – Measurement system – Orientation or position

Patent

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