Parametric outlier detection

Details Parametric outlier detection Parametric outlier detection

2006-06-13

2006-06-13

Wachsman, Hal (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system

Measured signal processing

C702S179000, C702S035000, C703S002000

Reexamination Certificate

active

07062415

ABSTRACT:
A method for determining outlier data points in. A subset of dataset patterns is selected from a set of mathematical dataset patterns, and the subset of dataset patterns is combined into a composite dataset. The composite dataset is compared to the dataset, and a degree of correlation between the composite dataset and the dataset is determined. Data points within the composite dataset are selectively weighted to improve the degree of correlation, and the steps described above are selectively iteratively repeated until the degree of correlation is at least a desired value. Residuals for the data points within the composite dataset are selectively determined. At least one of the weighted data points within the composite dataset that are weighted within a first specified range, and data points within the composite dataset that have a residual within a second specified range, are selectively output as outlier data points.

REFERENCES:
patent: 6424929 (2002-07-01), Dawes
patent: 2003/0144810 (2003-07-01), Tabor
patent: 2004/0039548 (2004-02-01), Selby et al.
patent: 2004/0138846 (2004-07-01), Buxton et al.
patent: 2004/0267477 (2004-12-01), Scott et al.

Affiliated with

Also associated with

Rating

Parametric outlier detection does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Parametric outlier detection, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Parametric outlier detection will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3652721