Part measurement prioritization system and method

Details Part measurement prioritization system and method Part measurement prioritization system and method

2005-08-15

2008-07-08

Raymond, Edward (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system

Dimensional determination

Reexamination Certificate

active

07398179

ABSTRACT:
A system, method, and apparatus are provided for prioritizing the measurements made on manufactured parts while maintaining specified part quality standards. According to the method, system and apparatus, the process used by the CMM is modified so that the number of measurements made is reduced in accordance with the results of the analysis provided herein. A CMM apparatus is modified in accordance with the analysis results. A method for part measurement prioritization in a measuring system and method includes describing a set of features to be measured on a plurality of substantially identical parts, separating the set of features into sensitive features and non-sensitive features, dividing the non-sensitive features into a plurality of groups, and prioritizing the part measurements to measure the sensitive features and provide alternating measurements of the non-sensitive features.

REFERENCES:
patent: 6064759 (2000-05-01), Buckley et al.
patent: 2002/0189319 (2002-12-01), Abbe
T. Gruget and D. Djurdjanovic, “Optimal reduction of measurements in an existing manufacturing process,” 2nd International Conference on Reconfigurable Manufacturing, University of Michigan, Ann Arbor, Aug. 2003.

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