Parameter setting method and circuit operation testing...

Details Parameter setting method and circuit operation testing... Parameter setting method and circuit operation testing...

2006-12-21

2008-12-09

Wachsman, Hal D (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C702S057000, C702S117000, C703S014000, C716S030000

Reexamination Certificate

active

07463988

ABSTRACT:
The invention provides a method for testing a circuit operation (circuit simulation), which is conducted by using a model of high precision. After parameters are extracted by using a model of which physical precision is low and parameter extraction time is short from measurement data, the parameters are converted to those obtained by a model of which parameter extraction time is generally long and a circuit operation test is performed by a model of high physical precision. In other words, a parameter is extracted first by a model of low physical precision and then, the extracted parameter is converted into a parameter obtained by the model of high physical precision. Finally, a circuit operation test is performed by using the model having high physical precision.

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Iniguez, B. et al, “Unified model for short-channel poly-Si TFTs,” Solid-State Electronics, vol. 43, 1999, pp. 1821-1831.

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