Semiconductor integrated circuit having built-n self test...

Details Semiconductor integrated circuit having built-n self test... Semiconductor integrated circuit having built-n self test...

2007-03-08

2010-06-08

Ton, David (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S718000

Reexamination Certificate

active

07734975

ABSTRACT:
A semiconductor integrated circuit contains a logic circuit which operates upon receiving a clock; a logic built-in self test circuit which executes a built-in self test of said logic circuit, said logic built-in self test circuit having a pattern generator which generates a pattern to be input to said logic circuit, a pattern compactor which receives data output from said logic circuit that has received the pattern, compacts the data, and outputs a result, and a logic built-in self test control unit which controls operations of said pattern generator and said pattern compactor and controls an operation of causing a scan path in said logic circuit to shift upon receiving the pattern; a device circuit which operates upon receiving the clock; and a device circuit built-in self test circuit which executes a built-in self test of said device circuit.

REFERENCES:
patent: 5553236 (1996-09-01), Revilla et al.
patent: 6061811 (2000-05-01), Bondi et al.
patent: 6556901 (2003-04-01), Sugimura et al.
patent: 7218566 (2007-05-01), Totolos et al.
patent: 7596708 (2009-09-01), Halepete et al.
patent: 2005/0097418 (2005-05-01), Anzou et al.
patent: 2007/0011535 (2007-01-01), Anzou et al.
patent: 2005-031018 (2005-02-01), None

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