4. Optical waveguides
  5. Polarization without modulation

Tetsu Hasegawa

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Apparatus for delay fault testing of integrated circuits

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
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Optical device

Optical waveguides – Temporal optical modulation within an optical waveguide – Electro-optic
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Optical device

Optical waveguides – With optical coupler – Particular coupling structure
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Semiconductor integrated circuit having built-n self test...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Semiconductor integrated circuit, design support apparatus,...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
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Profile ID: LFUS-PAI-P-2869895

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