Active solid-state devices (e.g., transistors, solid-state diode
Combined with electrical contact or lead
Of specified material other than unalloyed aluminum
Inventor
active
Copper damascene integration scheme for improved barrier layers
Copper interconnects
Decreasing metal-silicide oxidation during wafer queue time
Impurity doped UV protection layer
Interconnect structure with dielectric barrier and...
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Profile ID: LFUS-PAI-P-2798661