Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified material other than unalloyed aluminum
Reexamination Certificate
2005-01-20
2010-06-08
Warren, Matthew E (Department: 2815)
Active solid-state devices (e.g., transistors, solid-state diode
Combined with electrical contact or lead
Of specified material other than unalloyed aluminum
C257S639000, C257S640000, C257S649000, C257SE23019, C257SE23116, C257SE23132
Reexamination Certificate
active
07732923
ABSTRACT:
An ultra-violet (UV) protection layer is formed over a semiconductor workpiece before depositing a UV curable dielectric layer. The UV protection layer prevents UV light from reaching and damaging underlying material layers and electrical devices. The UV protection layer comprises a layer of silicon doped with an impurity, wherein the impurity comprises O, C, H, N, or combinations thereof. The UV protection layer may comprise SiOC:H, SiON, SiN, SiCO:H, combinations thereof, or multiple layers thereof, as examples.
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Ko Chung-Chi
Lu Yung-Cheng
Wu Zhen-Cheng
Slater & Matsil L.L.P.
Taiwan Semiconductor Manufacturing Company , Ltd.
Warren Matthew E
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