4. Excavating

Yuejian Wu

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Delay fault testing with IEEE 1149.1

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Fuzzy multiple signature compaction scheme for built-in self-tes

Excavating
Patent

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Method and apparatus for self-testing multi-port RAMs

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Patent

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Methods and apparatus for fault diagnosis in self-testable syste

Excavating
Patent

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System and method for testing TDM sRAMs

Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate

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