4. Optics: measuring and testing
  5. By polarized light examination
  6. With polariscopes

Yoshiyuki Yonezawa

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Birefringence distribution measuring method

Optics: measuring and testing – By polarized light examination – With polariscopes
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Composite integrated circuit and its fabrication method

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate

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Semiconductor device and manufacturing method thereof

Active solid-state devices (e.g. – transistors – solid-state diode – Physical configuration of semiconductor – With specified crystal plane or axis
Reexamination Certificate

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Semiconductor device and manufacturing method thereof with a...

Active solid-state devices (e.g. – transistors – solid-state diode – Specified wide band gap semiconductor material other than... – Diamond or silicon carbide
Reexamination Certificate

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Thin film device

Active solid-state devices (e.g. – transistors – solid-state diode – Thin active physical layer which is – Heterojunction
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1294511

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