Optics: measuring and testing – By polarized light examination – With polariscopes
Patent
1995-06-06
1996-12-24
Rosenberger, Richard A.
Optics: measuring and testing
By polarized light examination
With polariscopes
G01N 2123
Patent
active
055877931
ABSTRACT:
A sample is placed between a circular polarizer and an analyzer in an optical path between a monochromatic light source and a two-dimensional optical receiver. Parallel beams emitted from the monochromatic light source are converted into circularly polarized light by the circular polarizer. After transmitting the sample, the light is guided to the analyzer. While rotating the analyzer about the axis of the beams, image data are detected by optical receiver at a step of a regular rotation angle, and the detected image data are sampled to be sent to an image processing device in the next stage. On the basis of the image data, an operation is conducted on each pixel to obtain a relative phase difference due to birefringence of the sample, the two-dimensional birefringence distribution including the sign of the relative phase difference, and also the principal axis direction.
REFERENCES:
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"Solid-State Laser Engineering", Koechner, W., Third Completely Revised and Updated Edition, pp. 393-394, 1992.
Masato Noguchi et al., "Measurement of 2-D Birefringence Distribution" SPIE vol. 1720 (1992) pp. 367-378.
V. S. Chudakov, "Investigation of Induced Birefringence with a Rotating Polarization Element" Instrum. & Exper. Techn. vol. 20, (1977) pp. 241-244.
Otani et al., "Two-dimensional Birefringence Measurement Using the Phase Shifting Technique" SPIE vol. 1720, pp. 346-354 (1992).
Matsuura et al, "Measurement of flow-birefringence using a circularly polarized laser beam". Optics and Laser Technology vol. 10, No. 5 (Oct. 1978) pp. 237-240.
Akatsuka Masanori
Izawa Yasukazu
Nakai Sadao
Ohmi Masato
Yamanaka Chiyoe
Fuji Electric & Co., Ltd.
Institute for Laser Technology
Nakai Sadao
Rosenberger Richard A.
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