4. Static information storage and retrieval
  5. Read/write circuit
  6. Testing

William Schwarz

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Built-in self-test unit having a reconfigurable data...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Data retention weak write circuit and method of using same

Static information storage and retrieval – Read/write circuit – Testing
Patent

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Fast built-in self-repair circuit

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
Reexamination Certificate

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Method and system for performing built-in self-test routines...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Method and system for performing built-in-self-test routines...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1130727

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