4. Abrading
  5. Abrading process
  6. Glass or stone abrading

William Francis Landers

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Apparatus for mapping scratches in an oxide film

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Device and method for preventing settlement of particles on a ch

Semiconductor device manufacturing: process – Chemical etching – Combined with the removal of material by nonchemical means
Patent

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Low-k interlevel dielectric layer (ILD)

Active solid-state devices (e.g. – transistors – solid-state diode – With means to control surface effects – Insulating coating
Reexamination Certificate

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Method and apparatus for imaging surface topography of a wafer

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions
Patent

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Method for mapping scratches in an oxide film

Semiconductor device manufacturing: process – With measuring or testing – Optical characteristic sensed
Patent

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Profile ID: LFUS-PAI-P-901869

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