4. Semiconductor device manufacturing: process
  5. With measuring or testing

Toppan Photomasks, Inc.

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Apparatus and method for optimizing a pellicle for off-axis...

Optical: systems and elements – Having significant infrared or ultraviolet property – Multilayer filter or multilayer reflector
Reexamination Certificate

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Method and apparatus for calibrating a metrology tool

Active solid-state devices (e.g. – transistors – solid-state diode – Incoherent light emitter structure – Encapsulated
Reexamination Certificate

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Method for calibrating a metrology tool

Semiconductor device manufacturing: process – With measuring or testing
Reexamination Certificate

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Network-based photomask data entry interface and instruction...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Network-based photomask data entry interface and instruction...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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