4. Computer-aided design and analysis of circuits and semiconductor
  5. Integrated circuit design processing
  6. Logic design processing

Todd E. Leonard

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Critical path redundant logic for mitigation of hardware...

Electronic digital logic circuitry – With test facilitating feature
Reexamination Certificate

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Dynamic critical path detector for digital logic circuit paths

Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Logic design processing
Reexamination Certificate

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Method for monitoring channel eye characteristics in a...

Multiplex communications – Diagnostic testing – Determination of communication parameters
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Multilevel parallel CRC generation and checking circuit

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
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Scalable cyclic redundancy check circuit

Error detection/correction and fault detection/recovery – Pulse or data error handling – Error/fault detection technique
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Profile ID: LFUS-PAI-P-2179257

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