4. Measuring and testing
  5. Surface and cutting edge testing
  6. Roughness

Tetsuji Onuki

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Cantilever and measuring apparatus using it

Radiant energy – Inspection of solids or liquids by charged particles
Patent

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Compound type microscope

Radiant energy – Inspection of solids or liquids by charged particles
Patent

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Scanning probe microscope

Measuring and testing – Surface and cutting edge testing – Roughness
Patent

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Scanning probe microscope

Radiant energy – Inspection of solids or liquids by charged particles
Patent

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Scanning probe type microscope apparatus

Radiant energy – Inspection of solids or liquids by charged particles
Patent

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Profile ID: LFUS-PAI-P-310763

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