4. Excavating

Tak M. Mak

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Bus signature analyzer and behavioral functional test method

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate

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Device testing

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Error detecting circuit

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Flip-chip having an on-chip decoupling capacitor

Active solid-state devices (e.g. – transistors – solid-state diode – Integrated circuit structure with electrically isolated... – Passive components in ics
Reexamination Certificate

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Functional testing of logic circuits that use high-speed links

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate

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Profile ID: LFUS-PAI-P-586968

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